2 article(s) from Egberts, Philip

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

  • Nicholas Chan,
  • Carrie Lin,
  • Tevis Jacobs,
  • Robert W. Carpick and
  • Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

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Published 06 May 2020

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

  • Zahra Abooalizadeh,
  • Leszek Josef Sudak and
  • Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

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Published 03 Jul 2019
 
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